Maklumat Insitusi
Nama | Crest Analytic Sdn Bhd (CREST) |
---|---|
Kategori | Makmal Pengujian Swasta |
Aras | 3 |
Mukim | |
Daerah | |
Parlimen | |
Alamat | Crest Systems (M) Sdn Bhd, No. 1, One Puchong Business Park, Jalan OP 1/2, Off, Jalan Puchong, 47160 Puchong, Selangor |
Peralatan Makmal R&D Nanoteknologi
Bil | Jenis Peralatan | Nama Peralatan |
---|---|---|
1 | Electron Based | Desktop Scanning Electron Microscope (SEM) |
2 | Sifat Fizikal | Optical Digital Microscope |
3 | Sifat Fizikal | Refractometer (Refractive Index Measurement) |
4 | Sifat Fizikal | Polarimeter (purity, concentration) |
5 | Sifat Kimia | Confocal Raman Microscope with Fast Chemical Imaging Measurement |
6 | x-Ray Based | X-Ray Imaging with Micro-CT |
7 | Laser Based | Confocal Raman Microscope with Fast Chemical Imaging Measurement |
8 | Laser Based | Laser Scanning Microscope |
9 | Laser Based | Nano Particle Size Analyzer |
10 | Laser Based | Zeta Potential Analyzer |
Makmal R&D Nanoteknologi
Bil | Jenis Makmal | Nama Makmal |
---|---|---|
no records found |
Sumber Manusia
Bil | Bidang | Nama | |
---|---|---|---|
1 | Bahan | Melvin Wong | melvin.wong@crest-group.net |
2 | Nanoteknologi | Lim Hoo Kooi | Tiada |
Harta Intelek
Bil | Jenis Harta Intelek | Nama Harta Intelek |
---|---|---|
no records found |
Pengkomersialan
Bil | Faktor Penghalangan | nyatakan Faktor Penghalangan |
---|---|---|
no records found |
Projek
Bil | Jenis Projek | Nama Projek |
---|---|---|
no records found |